 |
FDL-5000型透射電子顯微鏡的數(shù)碼影像系統(tǒng)
|
| |
在不需要暗室的情況下，為捕獲透射電子顯微鏡圖像提供更高的靈敏度，更寬的動態(tài)范圍和理想線性。FDL5000通過一個可擦寫的成像平板讀取投射電子顯微鏡的圖像，在動態(tài)范圍遠(yuǎn)優(yōu)于膠片的情況下，得到驚人的25微米像素圖像。富士獨有的方法完全取消了暗室，為研究者節(jié)省下更多的研究時間。
|
 |
|
FDL-5000型的特點
|
| |
 |
成像平板可調(diào)至與傳統(tǒng)的投射電子顯微鏡膠片同樣大小 |
| |
成像平板盒能夠滿足各種類型的透射電子顯微鏡，包括：JEOL，Hitachi，Zeiss和Phillips等品牌機(jī)型 |
|
比膠片更高的靈敏度 |
| |
成像平板探測區(qū)與傳統(tǒng)的膠片一樣大小而且要靈敏的多，使研究人員能夠容易地觀察到對光束敏感的樣品，磷屏尺寸與大多數(shù)的膠片相同，所以IP可以用于任何TEMs |
|
捕獲各個級別的強(qiáng)度用于精確分析 |
| |
成像平板天生的寬動態(tài)范圍比膠片要出眾的多。在一個單獨的畫面內(nèi)強(qiáng)度變化很大的衍射圖案都能都被觀察到 |
|
準(zhǔn)確地測量電子劑量 |
| |
FDL5000的線性信號強(qiáng)度使得衍射圖案電子劑量的測量成為可能，而且HERM圖像比膠片要精確的多。數(shù)字處理的功能也能夠幫助增強(qiáng)和顯現(xiàn)所期望的結(jié)構(gòu)部分 |
|
相片質(zhì)量的圖像 |
| |
Pictrography打印機(jī)能夠在6分鐘之內(nèi)傳送出相片質(zhì)量的圖像 |
|
FDL-5000型的應(yīng)用
|
| |
Capture high-resolution images of superb clarity
|
 |
25µm-pixel, high-resolution images deliver clear visualization of your specimen, even when a high-speed shutter is used.
View of HNb2O5 from a Hitachi H-1250.
Accelerating voltage: 1000 kV
Magnification: x 800,000
Electron dose (C/cm2): 4 x 1012. |
| |
Adjust images quickly and reliably with Image Gauge
|
 |
Brightness/Contrast functions in Image Gauge - standard on all FDL 5000 systems - deliver clear images quickly and reliably.
View of carbon nanotube from a Phillips EM400.
Accelerating voltage: 120kV
Magnification: x 300,000.
|
| |
Enhance your observation of low-contrast images
|
 |
Wide-angle detection and 3,760 x 3,000 resolution provide superb visualization of low-contrast images.
Cross-sectional view of radish leaf from a Hitachi H-7100.
Accelerating voltage; 100kV
Magnification: x 8,500.
|
| |
Obtain photographic-grade images without the use of film
|
 |
Using the Fujifilm FDL 5000, you can easily obtain a final, photographic-grade image without tedious darkroom work.
View of insect compound eye from a Topcon EM002B/Bio-p.
Accelerating voltage: 80kV
Magnification: x 50.
|
| |
Capture high-quality, low-dose images through excellent sensitivity
|
 |
The use of an Imaging Plate maximizes the effect of energy filters.
Diffraction pattern of compound semiconductor from a
Zeiss EM912 OMEGA.
Accelerating voltage: 120kV; Zero-loss image.
|
| |
| Detecting beam |
Electron beam (40 kV - 100 kV) |
| IP size |
99.6 x 80.9 mm |
| Effective area |
94.0 x 75.0 mm |
| Readout pixel size |
25µm / 50µm |
| Bit depth |
14 bits (16,384 gray levels) |
| Latitude (dynamic range) |
4 orders of magnitude/1 frame |
| Sensitivity |
2 x 10-14 - 2 x 10-9 C/cm2 (100 kV) |
| Readout time |
Approx. 2.5 min/1 frame |
| Power conditions |
AC100 -120 / 200-240 V |
| Voltage regulation |
-10% - +10% |
| Frequency |
50 - 60 Hz |
| Power consumption |
0.4 kVA (100 V / 200 V) |
| Dimension |
800 (W) x 726 (D) x 1058 (H) mm |
| Weight |
190 kg |
|
 |
|
系統(tǒng)工作流程：有了FDL5000，您就可以連續(xù)地記錄、顯示、打印、存儲電鏡影像，而無需費時費力地使用膠片和暗房。
|
